IP-4475 / Design & lifecycle
Garmo Test & Repair OS
DFT insertion, ATPG/MBIST/test orchestration, diagnosis, repair, characterization and evidence management across silicon lifecycle.
Architecture programDiscuss this module
A defined role.
A precise boundary.
Bind Garmo Test & Repair OS to the existing Silicon Graph and the selected Foundry OS/model/evidence contracts. Do not duplicate the platform or infer cross-domain qualification.
- Canonical identity
- IP-4475
- Scope
- DFT insertion, ATPG/MBIST/test orchestration, diagnosis, repair, characterization and evidence management across silicon lifecycle.
- Runtime & availability
- Not a downloadable executable in this website package. Use the module to scope an existing GSP integration or request a controlled release.
- Evidence
- Canonical engineering scope is recorded. Executable, physical and external qualification evidence must be bound to the selected implementation release.
- Source
- Bible v7.42, section 123, IP-4475
Related engineering.
IP-4476
Garmo IP Factory
Reusable semiconductor-IP generation, qualification, packaging, dependency, release and evidence automation.
IP-4477Garmo Memory Compiler
Memory architecture/compiler layer spanning arrays, banking, ECC/BISR, timing/power views, wrappers, physical integration and qualification.
IP-4478Garmo Secure Silicon Compiler
Threat-model-driven root-of-trust, secure boot, identity, lifecycle, debug, attestation, isolation, information-flow and attack-test integration.